2017
DOI: 10.1016/j.jcrysgro.2017.04.022
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Scaling properties of equilibrating semiconductor mounds of various initial shapes

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Cited by 4 publications
(6 citation statements)
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“…Because of this, the scaling characteristics obtained in equations ( 13) and ( 15) are the same with found out ones in Ref. [12] as expected. While the slope of the 𝑙𝑜𝑔(ℎ(0) − ℎ(𝜏)) − 𝑙𝑜𝑔(𝜏) curves belonging to the studied sinusoidal surfaces was found as 𝛼 ≈ 0.36 in Ref.…”
Section: Resultssupporting
confidence: 87%
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“…Because of this, the scaling characteristics obtained in equations ( 13) and ( 15) are the same with found out ones in Ref. [12] as expected. While the slope of the 𝑙𝑜𝑔(ℎ(0) − ℎ(𝜏)) − 𝑙𝑜𝑔(𝜏) curves belonging to the studied sinusoidal surfaces was found as 𝛼 ≈ 0.36 in Ref.…”
Section: Resultssupporting
confidence: 87%
“…While the slope of the 𝑙𝑜𝑔(ℎ(0) − ℎ(𝜏)) − 𝑙𝑜𝑔(𝜏) curves belonging to the studied sinusoidal surfaces was found as 𝛼 ≈ 0.36 in Ref. [12], it was found as 𝛼 ≈ 0.35 for the sinusoidal surfaces studied here. The 𝛼 values are close to each other due to the surface similarity.…”
Section: Resultsmentioning
confidence: 56%
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“…These equations are obtained in Ref. [24] by taking into account repulsive interaction between steps only. In this study, besides repulsive step-step interaction of the form [5,25,26] it is suggested an attractive interaction expression.…”
Section: Theorymentioning
confidence: 99%