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DOI: 10.32657/10356/144282
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Scalable techniques for extending lifetime reliability of manycore systems

Abstract: First, I want to thank my supervisor Prof. Thambipillai Srikanthan for giving me the opportunity of undertaking a Ph.D. under his sage guidance. His vision and most insightful advice have shaped this endeavor into a fruitful culmination-from choosing the topic to developing ideas and identifying any missing pieces to thesis writing. The motivation and kind support that he has provided have enabled the smooth continuation of the Ph.D., especially around the birth of my second daughter. This thesis would not hav… Show more

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Cited by 1 publication
(1 citation statement)
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“…Some DRM research accounts for thermal cycling as a controllable metric [22], while others focus on electromigration [37], and others also consider the time-dependent dielectric breakdown [35,36] or on negative bias temperature instability [24,27]. Only one work accounts for process variation [38] and one for hot carry injection [24].…”
Section: Related Work In Drm and Dtmmentioning
confidence: 99%
“…Some DRM research accounts for thermal cycling as a controllable metric [22], while others focus on electromigration [37], and others also consider the time-dependent dielectric breakdown [35,36] or on negative bias temperature instability [24,27]. Only one work accounts for process variation [38] and one for hot carry injection [24].…”
Section: Related Work In Drm and Dtmmentioning
confidence: 99%