2012
DOI: 10.1017/s1431927612003790
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Sample surface atomic resolution secondary electron imaging with an aberration corrected STEM

Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Cited by 2 publications
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“…Surface-sensitive techniques in TEM, such as secondary electron imaging in scanning TEM, could reveal the presence and role of chiral facets during growth 224 . However, imaging surface molecules remains difficult because of their lack of contrast and sensitivity to the electron beam.…”
Section: Tomographic and Crystallographic Analysismentioning
confidence: 99%
“…Surface-sensitive techniques in TEM, such as secondary electron imaging in scanning TEM, could reveal the presence and role of chiral facets during growth 224 . However, imaging surface molecules remains difficult because of their lack of contrast and sensitivity to the electron beam.…”
Section: Tomographic and Crystallographic Analysismentioning
confidence: 99%
“…In Fig. 2D is an example of a photograph of the atomic column in metal, obtained by SE (Inada et al, 2011a). High-resolution observation by SE enables direct determination of the supporting states of catalyst particles, etc.…”
Section: Configuration Of the Aberration-correction Systemmentioning
confidence: 99%
“…EV3000 has two kinds of detector, one is for spectrum and another is three-channel photo-multipliers for direct element observation using an electro-magnetic prism (Kaji et al, 2001;Isakozawa et al, 2008). In addition to STEM imaging, the HD-2700 including an aberration-correction device performs SE imaging with atomic-level resolution, and also elemental analysis, mapping of the chemical bond statuses, etc., it can collect information from specimens in a versatile manner, and it dramatically improves analysis performance (Zhu et al, 2009;Inada et al, 2011aInada et al, , 2011bInada & Zhu, 2014).…”
Section: Configuration Of the Aberration-correction Systemmentioning
confidence: 99%
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