1988
DOI: 10.1002/xrs.1300170303
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Sample preparation method for major‐element analyses of carbonate rocks by X‐ray spectrometry

Abstract: A sample preparation method is described which permits fast and accurate wavelength‐dispersive, x‐ray fluorescence analysis of ten major oxides in carbonate rocks. The sample is first ground into a fine powder, then calcined, its loss‐on‐ignition (LOI) is determined and finally it is fused into a glass disc with lithium tetraborate at 1100°C using a 1:10 sample‐to‐flux ratio. Geological reference standards and synthetic standards are used for calibration. Matrix effects are corrected empirically using Lachance… Show more

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Cited by 4 publications
(5 citation statements)
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“…-Determination of the remaining elements. Silicon, Al, Fe, Ca, Mg, Na, K, Ti, Zr, Hf, P, Sr, As, Mn, S and Cl were determined by XRF (Baker 1982, van Zyl 1982, Hickson and Juras 1986, Rouseau and Bouchard 1986, Anderson 1987, King and Vivit 1988, Feret 1990, Gazulla et al 1991, Conture et al 1993, Buhrke et al 1998, Obenauf 2002).…”
Section: Methodsmentioning
confidence: 99%
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“…-Determination of the remaining elements. Silicon, Al, Fe, Ca, Mg, Na, K, Ti, Zr, Hf, P, Sr, As, Mn, S and Cl were determined by XRF (Baker 1982, van Zyl 1982, Hickson and Juras 1986, Rouseau and Bouchard 1986, Anderson 1987, King and Vivit 1988, Feret 1990, Gazulla et al 1991, Conture et al 1993, Buhrke et al 1998, Obenauf 2002).…”
Section: Methodsmentioning
confidence: 99%
“…Silicon, Al, Fe, Ca, Mg, Na, K, Ti, Zr, Hf, P, Sr, As, Mn, S and Cl were determined by XRF (Baker 1982, van Zyl 1982, Hickson and Juras 1986, Rouseau and Bouchard 1986, Anderson 1987, King and Vivit 1988, Feret 1990, Gazulla et al 1991, Conture et al 1993, Buhrke et al 1998, Obenauf 2002). Silicon, Al, Fe, Ca, Mg, Na, K, Ti, Zr, Hf, P, Sr, As, Mn, S and Cl were determined by XRF (Baker 1982, van Zyl 1982, Hickson and Juras 1986, Rouseau and Bouchard 1986, Anderson 1987, King and Vivit 1988, Feret 1990, Gazulla et al 1991, Conture et al 1993, Buhrke et al 1998, Obenauf 2002).…”
Section: 4mentioning
confidence: 99%
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“…A literature search showed that the following additives are used as bead-releasing agents: NaI, LiBr, NH 4 I, LiI, and LiF [5][6][7][8]. However, studies also show that the use of a release agent may interfere in the WD-XRF measurement of a fused bead sample if the release agent contains an analyte element, or if it produces matrix effects (absorption and strengthening) or line overlap [9].…”
Section: Introductionmentioning
confidence: 99%