2008
DOI: 10.1016/j.micron.2008.05.006
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Sample preparation for scanning electron microscopy of plant surfaces—Horses for courses

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Cited by 146 publications
(103 citation statements)
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“…Samples were then coated with gold using a sputter coater (Jeol JFC-1100E, Japan). Finally, samples were scanned using a scanning electron microscope (Jeol model JSM 5410, Japan) [29].…”
Section: Scanning Electron Microscopy (Sem)mentioning
confidence: 99%
“…Samples were then coated with gold using a sputter coater (Jeol JFC-1100E, Japan). Finally, samples were scanned using a scanning electron microscope (Jeol model JSM 5410, Japan) [29].…”
Section: Scanning Electron Microscopy (Sem)mentioning
confidence: 99%
“…A fresh leaf of each faba bean cultivar was observed for SEM in their native-hydrated state with 1045× magnification at 7.36 kv and a pressure of 33 Pa (Pathan et al, 2008).…”
Section: Plant Materialsmentioning
confidence: 99%
“…Nevertheless, since it is a simple method, it may be an alternative when the objective of documentation is only observation of the anatomy and distribution of the constituent elements of the stem. Critical point drying with CO 2 is the most common method of tissue dehydration for preparation of samples for microscopy (PATHAN et al, 2008). Critical point drying with CO 2 proved to be adequate in preservation of both the structures of the gerbera stems ( Figure 9) and the microorganisms and exopolysaccharides of bacteria present in the samples (Figure 10 and 11).…”
Section: Dryingmentioning
confidence: 99%