2007
DOI: 10.1016/j.jmmm.2006.10.1101
|View full text |Cite
|
Sign up to set email alerts
|

SAF exhibits better resistance to roughness edge than single-free layer

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2009
2009
2011
2011

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 7 publications
0
1
0
Order By: Relevance
“…15) Other important factors include Joule heating effects during current-induced magnetization switching experiments, 16) magnetic dead layers, 17) and defects formed during nanofabrication. 18) One suitable experimental method can be the waiting time measurements where the probability of magnetization switching is measured for a given waiting time at an applied magnetic field, not current, just below the switching field and the results are fitted with the Neel-Brown equation to extract E M . 19) It is important to point out that, since the results calculated in this study are essentially based on micromagnetic simulation, the accuracy of which has been confirmed substantially in recent years in general magnetics research, in particular magnetic recording, the present results should provide a good guide in analyzing experimental results as well as in designing magnetic cells in advanced magnetic devices such as high density MRAM.…”
Section: Resultsmentioning
confidence: 99%
“…15) Other important factors include Joule heating effects during current-induced magnetization switching experiments, 16) magnetic dead layers, 17) and defects formed during nanofabrication. 18) One suitable experimental method can be the waiting time measurements where the probability of magnetization switching is measured for a given waiting time at an applied magnetic field, not current, just below the switching field and the results are fitted with the Neel-Brown equation to extract E M . 19) It is important to point out that, since the results calculated in this study are essentially based on micromagnetic simulation, the accuracy of which has been confirmed substantially in recent years in general magnetics research, in particular magnetic recording, the present results should provide a good guide in analyzing experimental results as well as in designing magnetic cells in advanced magnetic devices such as high density MRAM.…”
Section: Resultsmentioning
confidence: 99%