1983
DOI: 10.1109/tr.1983.5221735
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S-Shaped Reliability Growth Modeling for Software Error Detection

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Cited by 733 publications
(284 citation statements)
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“…) λyex(t) = abre −bt e −r(1−e −bt ) Gompertz [7], [9], [11] GOMP S-shaped We have compared eight most widely used NHPP models for modelling of the fault detection process: MusaLogarithmic, Goel-Okumoto Exponential, Generalized GoelOkumoto, Inflection S-shaped, Delayed S-Shaped, YamadaExponential, Gompertz and Logistic, whose mean value function and failure intensity are given in the Table I.…”
Section: A Fault Detection Process As Nhppmentioning
confidence: 99%
“…) λyex(t) = abre −bt e −r(1−e −bt ) Gompertz [7], [9], [11] GOMP S-shaped We have compared eight most widely used NHPP models for modelling of the fault detection process: MusaLogarithmic, Goel-Okumoto Exponential, Generalized GoelOkumoto, Inflection S-shaped, Delayed S-Shaped, YamadaExponential, Gompertz and Logistic, whose mean value function and failure intensity are given in the Table I.…”
Section: A Fault Detection Process As Nhppmentioning
confidence: 99%
“…The following [11] a=135.965, α =.138, η=1.000E-4 2TL1 [5] a=135.965, α =49.216, η1 =.003, η2 =1.000E-4 2TL2 [6] a=135.974, α =2.611, η1 =2.566, η2 =.001, τ =6.562 Comparison under dataset [2] Model Parameters G-O [1] a= 218.159, b=.041 Chiu [11] a=215.706, α =.042, η=.001 2TL1 [5] a=215.706, α =56.69, η1 =.001, η2 =.001 2TL2 [6] a=210.134, α =.094, η1 =.442, η2 =1.000E-5, τ =7.007E-5 Comparison under dataset [3] Model Parameters G-O [1] a= 33.6, b=.063 Chiu [11] a=24.821, α =.024, η=.343 2TL1 [5] a=24.821, α =.056, η1 =.424, η2 =.343 2TL2 [6] a=24.821, α =.217, η1 =.658, η2 =.343, τ =.119 Comparison under dataset [4] Model Parameters G-O [1] a= 133.761, b=.015 Chiu [11] a=133.496, α =.146, η=.001 2TL1 [5] a=133.496, α =153.843, η1 =.001, η2 =.001 2TL2 [6] a=133.496, α =.002, η1 =909.569, η2 =.001, τ =1.748 Comparison under dataset [5] Model Parameters G-O [1] a= 18.257, b=.397 Chiu [11] a=18.254, α =.397, η=.001 2TL1 [5] a=18.254, α =.049, η1 =8.151, η2 =.001 2TL2 [6] a=18.257, α =23.658, η1 =.665, η2 =1.000E-5, τ =15.341 Comparison under dataset [6] Model Parameters G-O [1] a= 124.44, b=.051 Chiu [11] a=124.171, α =.051, η=.001 2TL1 [5] a=124.171, α =.001, η1 =88.486, η2 =.001 2TL2 [6] a=124.437, α =.163, η1 =5.874, η2 =1.000E-5, τ =.909 Comparison under dataset [7] Model Parameters G-O [1] a= 23.092, b=.559 Chiu [11] a=22.252, α =.493, η=.332 2TL1 [5] a=22.252, α =.211, η1 =.2.338, η2 =.332 2TL2 [6] a=22.252, α =9.048, η1 =.195, η2 =.332, τ =1.272…”
Section: Parameter Estimationmentioning
confidence: 99%
“…Goel and Okumoto in [1] proposed an exponential SRGM. Yamada and Ohba in [2] proposed delayed S-shaped SRGM while Ohba in [3] proposed inflection S-shaped SRGM. Gokhale and Trivedi in [4] proposed an enhanced NHPP model which takes into account the time-dependent failures occurring in debugging process.…”
Section: Introductionmentioning
confidence: 99%
“…В основу більшості таких моделей покладено розподіл Пуассона, параметри якого мають різний вигляд для різних мо-делей. Найбільш поширеними моделями цього класу є моделі Гоеля-Окумото [11], S-подібна модель зростання надійності Ямади [12] тощо. Проте, основним недоліком відомих моделей на основі пуассонового процесу є те, що внаслідок припущень і спрощень, вони не достатньо адекватно відображають процес тестування, а результа-ти, отримані при їх застосуванні, не завжди збігаються з отриманими на практиці [13].…”
Section: аналіз літературних даних та постановка проблемиunclassified