S-Parameter Measurements of High-Temperature Superconducting and Normal Conducting Microwave Circuits at Cryogenic Temperatures

Abstract

A fixture is presented that accepts both normal and superconducting microstrip structures for S-parameter measurements. The use of small replaceable inserts and a compression contact for the strip makes the fixture especially suited for rapid prototype testing of microstrip circuits. The technique is explained and measurements at room temperature and at low temperatures are demonsuated.