2006
DOI: 10.1016/j.jcis.2006.08.015
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Rupture of thin films with resonant substrate patterning

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Cited by 42 publications
(66 citation statements)
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References 44 publications
(160 reference statements)
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“…A resonant interaction (similar to the one investigated by e.g. Kao et al 2006) between the wavenumbers of the structuring and the wavenumbers of the perturbation is incorporated into our model. Note that the matrix A np is not symmetric.…”
Section: Linear Stabilitymentioning
confidence: 99%
See 1 more Smart Citation
“…A resonant interaction (similar to the one investigated by e.g. Kao et al 2006) between the wavenumbers of the structuring and the wavenumbers of the perturbation is incorporated into our model. Note that the matrix A np is not symmetric.…”
Section: Linear Stabilitymentioning
confidence: 99%
“…Strongly nonlinear models of the instability based on the assumption that the film thickness is much smaller than the wavelength of the initial perturbation were developed by the same authors and used in the numerical studies of film rupture. The same long-wave approximation has been used to study film rupture on chemically patterned surfaces by Thiele et al (2003), Sharma et al (2003) and Kao et al (2006). Substrate heterogeneity was found to have a significant effect on film stability and nonlinear evolution and in some cases was shown to destabilize otherwise stable films.…”
Section: Introductionmentioning
confidence: 99%
“…Thiele et al considered the morphology evolution in a thin liquid film on substrates with one-and two-dimensional sinusoidal surface energy modulation (Brusch et al 2002;Thiele et al 2003;Pototsky et al 2004). Kao et al (2006) investigated the rupture of thin liquid films on substrates with sinusoidal and square-wave resonant surface energy patterning. Julthongpiput et al (2007) studied the transition from isotropic to patterndirected dewetting on substrates with differential surface energy contrast.…”
Section: Introductionmentioning
confidence: 99%
“…This allows parametrization of arbitrary experimental disjoining pressure isotherms, at least over a finite range of film thicknesses. While several groups have already studied dewetting of thin liquid films on structured surfaces (Kargupta et al 2000;Kargupta and Sharma 2002;Kargupta and Sharma 2003;Sehgal et al 2002;Zhang et al 2003;Brusch et al 2002;Thiele et al 2003;Pototsky et al 2004;Kao et al 2006;Julthongpiput et al 2007;Zhu et al 2010), most of the results have been obtained for small film thicknesses on order of ten times the precursor layer thickness, very specific disjoining pressure isotherms with more than one inflection point or neglecting the influence of gravity. For industrial applications relevant film thicknesses range typically between 1 and 10 lm, which is several orders of magnitude above the precursor layer thickness such that the influence of gravity can be substantial if not decisive.…”
Section: Introductionmentioning
confidence: 99%
“…The lack of long-range order in the dewetted structures hinders the utility of dewetting as a viable surface patterning technique for engineering of small structures. Thus, much theoretical (Konnur et al 2000;Kargupta and Sharma 2001Thiele et al 2001Thiele et al , 2003Brusch et al 2002;Simmons and Chauhan 2006;Kao et al 2006;Saprykin et al 2007) and experimental (Higgins and Jones 2000; The amplitude of the roughness on the surface is denoted by a Sehgal et al 2002;LeOpoldes and Damman 2006;Mukherjee et al 2008) effort has been directed in exploring the mechanisms and conditions required to align the self-organized dewetted structures by the use of physically and chemically heterogeneous substrates.…”
Section: Introductionmentioning
confidence: 99%