2011
DOI: 10.1209/0295-5075/95/30001
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Roughness correction to the Casimir force beyond perturbation theory

Abstract: Theory of quantized fields PACS 68.37.Ps -Atomic force microscopy (AFM) PACS 85.85.+j -Micro-and nano-electromechanical systems (MEMS/NEMS) and devicesAbstract -Up to now there has been no reliable method to calculate the Casimir force when surface roughness becomes comparable with the separation between bodies. Statistical analysis of rough Au films demonstrates rare peaks with heights considerably larger than the root-meansquare (rms) roughness. These peaks define the minimal distance between rough surfaces … Show more

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Cited by 39 publications
(58 citation statements)
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References 28 publications
(64 reference statements)
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“…It has been shown 44,45 that the disagreement between the experiment 47 and the theory describing roughness perturbatively 48,49 can be resolved by taking into account rare high peaks on rough surfaces. These high peaks can be described by "extreme value statistics," as follows from a statistical analysis of Atomic Force Microscopy (AFM) topography data for gold films.…”
Section: Roughness Correction To the Electrostatic Forcementioning
confidence: 99%
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“…It has been shown 44,45 that the disagreement between the experiment 47 and the theory describing roughness perturbatively 48,49 can be resolved by taking into account rare high peaks on rough surfaces. These high peaks can be described by "extreme value statistics," as follows from a statistical analysis of Atomic Force Microscopy (AFM) topography data for gold films.…”
Section: Roughness Correction To the Electrostatic Forcementioning
confidence: 99%
“…These high peaks can be described by "extreme value statistics," as follows from a statistical analysis of Atomic Force Microscopy (AFM) topography data for gold films. 44,45,50 Indeed, recently there has been more awareness of the importance of extreme value statistics for the analysis of rough surfaces. 51 The Casimir force between rough surfaces can be written as…”
Section: Roughness Correction To the Electrostatic Forcementioning
confidence: 99%
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“…The free energy can be expressed by the Lifshitz formula 1 via the dielectric properties of the bodies. Note that roughness of the bodies can only increase the value of Γ and for small d 0 this effect can be significant 6,26,27 . If only the dispersion pressure contributes to the adhesion energy, Γ and P C have the same physical origin and, therefore, are related to each other as energy and force: Γ = P C d 0 /(α − 1).…”
mentioning
confidence: 99%