Root cause prediction for failures in semiconductor industry, a genetic algorithm–machine learning approach

Abstract

Failure analysis has become an important part of guaranteeing good quality in the electronic component manufacturing process. The conclusions of a failure analysis can be used to identify a component’s flaws and to better understand the mechanisms and causes of failure, allowing for the implementation of remedial steps to improve the product’s quality and reliability. A failure reporting, analysis, and corrective action system is a method for organizations to report, classify, and evaluate failures, as well as plan corrective actions. These text feature datasets must first be preprocessed by Natural Language Processing techniques and converted to numeric by vectorization methods before starting the process of information extraction and building predictive models to predict failure conclusions of a given failure description. However, not all-textual information is useful for building predictive models suitable for failure analysis. Feature selection has been approached by several variable selection methods. Some of them have not been adapted for use in large data sets or are difficult to tune and others are not applicable to textual data. This article aims to develop a predictive model able to predict the failure conclusions using the discriminating features of the failure descriptions. For this, we propose to combine a Genetic Algorithm with supervised learning methods for an optimal prediction of the conclusions of failure in terms of the discriminant features of failure descriptions. Since we have an unbalanced dataset, we propose to apply an F1 score as a fitness function of supervised classification methods such as Decision Tree Classifier and Support Vector Machine. The suggested algorithms are called GA-DT and GA-SVM. Experiments on failure analysis textual datasets demonstrate the effectiveness of the proposed GA-DT method in creating a better predictive model of failure conclusion compared to using the information of the entire textual features or limited features selected by a genetic algorithm based on a SVM. Quantitative performances such as BLEU score and cosine similarity are used to compare the prediction performance of the different approaches.

A Review of Artificial Intelligence Techniques for Quality Control in Semiconductor Production

“…In addition, some techniques might not be applicable to the textual data. Hence, the study [11] has developed a prognosticative model capable of finding failure conclusions in accordance with the discriminating features of failure descriptions. GA (Genetic Algorithm) has been integrated and utilized with a supervised learning approach to accomplish this.…”