2017 Annual Reliability and Maintainability Symposium (RAMS) 2017
DOI: 10.1109/ram.2017.7889651
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Root cause analysis using artificial intelligence

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Cited by 12 publications
(5 citation statements)
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“…In this category, the main representatives are the Bayesian and Hybrid Bayesian networks. A Diagnostic Hybrid Bayesian Network is built in (Chigurupati and Lassar, 2017) to model the cause-effect relationship between the degradation parameters (cause) and failure modes (effect) that occur in order to capture the causesymptom relationship within the examined hardware system. The required step of assigning conditional probabilities for building up the Bayesian network topology is accomplished with the deployment of the linearly varying Weibull and Lognormal distributions.…”
Section: Resultsmentioning
confidence: 99%
“…In this category, the main representatives are the Bayesian and Hybrid Bayesian networks. A Diagnostic Hybrid Bayesian Network is built in (Chigurupati and Lassar, 2017) to model the cause-effect relationship between the degradation parameters (cause) and failure modes (effect) that occur in order to capture the causesymptom relationship within the examined hardware system. The required step of assigning conditional probabilities for building up the Bayesian network topology is accomplished with the deployment of the linearly varying Weibull and Lognormal distributions.…”
Section: Resultsmentioning
confidence: 99%
“…Both approaches are not scalable in large contexts where structured data is not available and manual preparation is not possible for several thousand workflows. An interesting approach in this context is provided by Chigurupati and Lassar [11], who presented a way to use a Bayesian network in order to model probabilities of failure paths for hardware.…”
Section: Single Pane Root Cause Analysismentioning
confidence: 99%
“…Both approaches are not scalable in large contexts where structured data is not available and manual preparation is not possible for several thousand workflows. An interesting approach in this context is provided by Chigurupati and Lassar [12], who presented a way to use a Bayesian network in order to model probabilities of failure paths for hardware.…”
Section: Single Pane Root Cause Analysismentioning
confidence: 99%