2019
DOI: 10.1016/j.vacuum.2018.10.077
|View full text |Cite
|
Sign up to set email alerts
|

Room temperature magnetron sputtering and laser annealing of ultrathin MoS2 for flexible transistors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

3
23
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 54 publications
(26 citation statements)
references
References 25 publications
3
23
0
Order By: Relevance
“…The resistance of these devices varied from 185 to 490 MΩ with an average of 347 MΩ as shown in the box plot of Fig. 1 c. The measured values of resistance for our MoS 2 devices are consistent with what has been reported in the literature 34 , 49 – 51 , 53 , 54 . After characterizing the as-prepared samples, we doped the MoS 2 film by immersing it in BV solution for 36 h (see “Method” section for detail) and measured their electrical transport properties.…”
Section: Resultssupporting
confidence: 88%
“…The resistance of these devices varied from 185 to 490 MΩ with an average of 347 MΩ as shown in the box plot of Fig. 1 c. The measured values of resistance for our MoS 2 devices are consistent with what has been reported in the literature 34 , 49 – 51 , 53 , 54 . After characterizing the as-prepared samples, we doped the MoS 2 film by immersing it in BV solution for 36 h (see “Method” section for detail) and measured their electrical transport properties.…”
Section: Resultssupporting
confidence: 88%
“…S11 correspond to molybdenum oxide. These oxide species were not detected by Raman spectroscopy, which indicates they are substitution for sulphur vacancies in the MoS 2 lattice rather than individual molybdenum oxides layers 34 . The second doublet W (6+) f 7/2 and W (6+) f 5/2 in W core level of Fig.…”
Section: Resultsmentioning
confidence: 93%
“…S7 b) again did not reveal any obvious vibrational modes for the oxide. This indicates that, just as with the MoS 2 layers, the films contain oxidised WS 2 rather than two individual layers of WS 2 and WO 3 (but with a higher level of oxidation for WS 2 compared to MoS 2 ) 34 . We hypothesize that the oxide content in both MoS 2 and WS 2 films has been significantly increased compared to individual tracks because the large area, overlapping raster scanned films which are required for the XPS analysis subjected the material to prolonged laser exposure which can be considered as the equivalent of prolonged thermal annealing in an oxidizing atmosphere.…”
Section: Resultsmentioning
confidence: 95%
“…Top‐gated FETs with bilayer and five‐layer MoS 2 channels showed a current on/off ratio of 10 4 and electron mobility of 0.0136 cm 2 V −1 s −1 and 0.0564 cm 2 V −1 s −1 , respectively. Sirota et al 109 reported direct sputtering of MoS 2 onto SiO 2 /Si and PDMS substrate. The single‐step MoS 2 magnetron sputtering was performed at room temperature for 120 s and followed with a laser annealing method using a pulsed 248 nm laser beam in air.…”
Section: Preparation Of Tmdcsmentioning
confidence: 99%
“…B, Schematic of top‐gated field effect transistor (FET) device fabrication on PDMS substrate with a laser annealing process. Reproduced with permission from Reference 109. C, Cross‐sectional and plane‐view HRTEM image of sputtered bilayer MoS 2 .…”
Section: Preparation Of Tmdcsmentioning
confidence: 99%