2015
DOI: 10.1016/j.mssp.2015.07.043
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Role of thermal annealing on SiGe thin films fabricated by PECVD

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Cited by 6 publications
(2 citation statements)
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References 29 publications
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“…For reference, the Raman scan of the as-deposited SiGe film was also included. The scan from the as-deposited sample showed peaks near 284, 363, and 462 cm −1 , related to the Ge-Ge, Si-Ge, and Si-Si TO (transverse optic) vibrational modes, respectively [14,15]. The peak from the Si-Ge vibrational mode confirmed the formation of the SiGe alloy.…”
Section: Raman Spectroscopymentioning
confidence: 99%
“…For reference, the Raman scan of the as-deposited SiGe film was also included. The scan from the as-deposited sample showed peaks near 284, 363, and 462 cm −1 , related to the Ge-Ge, Si-Ge, and Si-Si TO (transverse optic) vibrational modes, respectively [14,15]. The peak from the Si-Ge vibrational mode confirmed the formation of the SiGe alloy.…”
Section: Raman Spectroscopymentioning
confidence: 99%
“…[10][11][12] Moreover, the Si-Ge deposition at low temperature makes their integration on glass substrate possible, opening new possibilities for photonic and photovoltaic applications. 13 However, the drawback of this technique is the lack of consistency in the crystalline structure, which is characterized by the introduction of defects and quasiamorphous grains requiring further annealing [13][14][15] and metal induced crystallization process to obtain the Si-Ge polycrystals with desired properties. [16][17][18] Moreover, SiGe compound can be used in various applications with respect to its morphology.…”
Section: A Introductionmentioning
confidence: 99%