2012
DOI: 10.1186/1556-276x-7-552
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Role of surface composition in morphological evolution of GaAs nano-dots with low-energy ion irradiation

Abstract: The surface chemistry of GaAs (100) with 50-keV Ar+ ion beam irradiation at off-normal incidence has been investigated in order to elucidate the surface nano-structuring mechanism(s). Core level and valence band studies of the surface composition were carried out as a function of fluences, which varied from 1 × 1017 to 7 × 1017 ions/cm2. Core-level spectra of samples analyzed by X-ray photoelectron spectroscopy confirmed the Ga enrichment of the surface resulting in bigger sized nano-dots. Formation of such na… Show more

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Cited by 28 publications
(17 citation statements)
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References 32 publications
(43 reference statements)
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“…Concerning As core levels, upon oxidation a downshift by 0.15 eV up to BE = 40.38 eV is observed for As‐3d 5/2 , with the appearance of another couple of Voigt doublets with the J = 5/2 component at 43.71 and 43.32 eV, respectively, due to oxidation. While these values deviate from BEs in As 2 O 3 (44.9 eV ) and As 2 O 5 (45.8 eV), the central positions of the doublets are slightly lower than those reported for As 2 O 3 and As 2 O 5 species in oxidized GaAs . Therefore, we attribute both doublets to the formation of hybrid AsOCd bonds.…”
Section: Resultscontrasting
confidence: 76%
“…Concerning As core levels, upon oxidation a downshift by 0.15 eV up to BE = 40.38 eV is observed for As‐3d 5/2 , with the appearance of another couple of Voigt doublets with the J = 5/2 component at 43.71 and 43.32 eV, respectively, due to oxidation. While these values deviate from BEs in As 2 O 3 (44.9 eV ) and As 2 O 5 (45.8 eV), the central positions of the doublets are slightly lower than those reported for As 2 O 3 and As 2 O 5 species in oxidized GaAs . Therefore, we attribute both doublets to the formation of hybrid AsOCd bonds.…”
Section: Resultscontrasting
confidence: 76%
“…The energies of these charged carriers (~tens of eV) can be estimated using the transitions observed in OES spectra. These smaller values of energies are necessary to avoid the surface structuring arisen from the nuclear energy losses as reported in ions with energy of N 10 3 eV [34][35][36][37][38]. In OES results, strong Ar radiative as well as metastable radicals are observed at 750.89 nm, 763.51 nm, and 811.53 nm corresponding to 3p 5 4p(2 p1 ) → 3p 5 4s(1 s2 ), 3p 5 4p(2 p6 ) → 3p 5 4s(1 s5 ) and 3p 5 4p(2 p9 ) → 3p 5 4s(1 s5 ) transitions respectively, similarly to earlier reported in literature [26].…”
Section: Resultsmentioning
confidence: 99%
“…In the case of a binary compound, the difference in the sputtering rates also plays a significant role in the pattern formation onto a surface due to different masses present inside the material. The lighter element will sputter more readily than the one with higher mass, as seen by different research groups for InP [4], GaAs [34], Gasb [5], etc. But for the single element material, it may be difficult to achieve the ripple formation, although there are contradictory reports on this especially for the cases of Si targets [2,10] but not so clearly visible on Ge [18].…”
Section: Discussionmentioning
confidence: 99%