2009
DOI: 10.1016/j.surfcoat.2009.02.046
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Role of rapid thermal annealing in the formation of crystalline SiGe nanoparticles

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Cited by 10 publications
(7 citation statements)
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“…The process involves cosputtering of germanium, silicon, and silicon dioxide targets onto a silicon substrate and then annealing (at over 1100 °C) 27 or rapid thermal annealing (at 900 °C) in an inert atmosphere. 28,29 SiliconÀgermanium alloys have also been synthesized by thermal evaporation of powders of silicon and germanium on a glass substrate at temperatures greater than 1400 °C30,31 and by using molecular beam epitaxy, to grow siliconÀgermanium alloy nanoparticles on a silicon substrate. 32,33 In most cases, the matrix material passivates the nanoparticle surfaces well, but the range of possible surface treatments for the embedded nanoparticles and the flexibility of using embedded nanoparticles for device applications are very limited.…”
mentioning
confidence: 99%
“…The process involves cosputtering of germanium, silicon, and silicon dioxide targets onto a silicon substrate and then annealing (at over 1100 °C) 27 or rapid thermal annealing (at 900 °C) in an inert atmosphere. 28,29 SiliconÀgermanium alloys have also been synthesized by thermal evaporation of powders of silicon and germanium on a glass substrate at temperatures greater than 1400 °C30,31 and by using molecular beam epitaxy, to grow siliconÀgermanium alloy nanoparticles on a silicon substrate. 32,33 In most cases, the matrix material passivates the nanoparticle surfaces well, but the range of possible surface treatments for the embedded nanoparticles and the flexibility of using embedded nanoparticles for device applications are very limited.…”
mentioning
confidence: 99%
“…The Si/Ge/Si probably consists of relaxed Ge cores surrounded by the SiGe shells whereby the Si cap layer must be alloyed with Ge to form a SiGe shells around the Ge cores. It is possible that the Si cap layer plays a role in relieving stress and acts as a capping factor protecting the Ge core from getting oxidized [12]. Figure 4 shows the measured high resolution X-ray diffraction (HRXRD) of the three samples.…”
Section: Resultsmentioning
confidence: 99%
“…2−9 A. Kling 7 deposited a multilayer structure with five periods of amorphous SiGe nanoparticles/SiO 2 layers in different thicknesses by low-pressure chemical vapor deposition and annealed to crystallize. Joshi 8 reported the formation of SiGe crystalline nanoparticles embedded in the SiO 2 film by the atom beam sputtering method in conjunction with rapid thermal annealing. Lin 9 prepared SiGe nanoparticles of different sizes by a simple thermal evaporation method.…”
Section: Introductionmentioning
confidence: 99%
“…The fabrication of SiGe nanoparticles has been the object of experimental and theoretical research studies for many years. A. Kling deposited a multilayer structure with five periods of amorphous SiGe nanoparticles/SiO 2 layers in different thicknesses by low-pressure chemical vapor deposition and annealed to crystallize. Joshi reported the formation of SiGe crystalline nanoparticles embedded in the SiO 2 film by the atom beam sputtering method in conjunction with rapid thermal annealing. Lin prepared SiGe nanoparticles of different sizes by a simple thermal evaporation method.…”
Section: Introductionmentioning
confidence: 99%