“…Compared to the aforementioned techniques, an atomic-resolution electron probe is used to scan the films under study and the transmitted electrons are collected by multiple detectors, each one providing complementary structural, chemical, and electronic information. STEM-EELS has already been demonstrated to be a powerful tool that can identify electronic state modulations occurring in specific lattice positions of transition metal oxide heterostructures. − For instance, this technique enabled the identification of local valence modulations occurring at the interfaces of LaNiO 3 -based heterostructures induced by charge transfer effects. ,, In our study, however, since the Ni valence changes neither across the MIT nor from one nickelate compound to another, we also do not expect it to vary across the different electronic domains. Our approach is instead based on locally assessing electronic properties by looking at specific fingerprints, buried in the O K and Ni L edge fine structures, which are characteristic of the distinct electronic phases, as previously observed in X-ray absorption spectroscopy (XAS) experiments. ,,− Here we demonstrate that this is possible, reaching around 3.5 Å spatial resolution.…”