2021
DOI: 10.1039/d1cp02334a
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Role of low-energy electrons in the solubility switch of Zn-based oxocluster photoresist for extreme ultraviolet lithography

Abstract: Electron-induced reactions make an important contribution to the solubility switch of a novel Zn oxocluster resist in extreme ultraviolet lithography (EUVL). The study also gives direct evidence that chain reactions are involved in this process.

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Cited by 22 publications
(22 citation statements)
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“…As proposed before [ 14 , 16 , 17 ], the electron-induced fragmentation of precursors with carboxylate ligands is most likely triggered by ionization (see Figure 1 ). The present results indicate that carboxylate ligands with saturated side chains are more efficiently removed from the sublimate layer than the aromatic benzoate ligand.…”
Section: Discussionsupporting
confidence: 52%
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“…As proposed before [ 14 , 16 , 17 ], the electron-induced fragmentation of precursors with carboxylate ligands is most likely triggered by ionization (see Figure 1 ). The present results indicate that carboxylate ligands with saturated side chains are more efficiently removed from the sublimate layer than the aromatic benzoate ligand.…”
Section: Discussionsupporting
confidence: 52%
“…The same QMS as for the ESD experiments was used to record reference mass spectra during leaking of the individual gases into the vacuum chamber. This provides for a more reliable analysis than the use of literature data because the sensitivity of the instrument decreases towards higher m / z ratios [ 17 ]. We note that three different alkenes can be formed by cleaving a hydrogen radical from the alkyl radical C 5 H 11 • that is released upon loss of CO 2 from Ag(I) 2,2-dimethylbutanoate ( Figure 8 ).…”
Section: Resultsmentioning
confidence: 99%
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