2022
DOI: 10.1021/acsaelm.2c01258
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Role of Hydrogen in Suppressing Secondary Nucleation in Chemical Vapor-Deposited MoS2

Abstract: We investigate the ability of different carrier gases to control defects and secondary nucleation in atmospheric pressure chemical vapor deposition (APCVD) growth of MoS 2 on Si/SiO 2 substrates. We observe that a reducing environment using H 2 gas is more favorable for achieving uniform two-dimensional (2D) growth. Compared to the growth in an inert environment, secondary nucleation on primary MoS 2 domains grown using H 2 as the carrier gas (H−MoS 2 ) is drastically reduced. We employ a phase-field model to … Show more

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Cited by 3 publications
(4 citation statements)
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“…36,37 Because H 2 can reduce the secondary nucleation of CrS 2 . 42,43 The thickness of the grown CrS 2 is uniform. When H 2 and Ar are introduced, the average thickness is about 5.878 nm, while when only Ar is introduced, the average thickness is about 26.845 nm (Fig.…”
Section: Resultsmentioning
confidence: 99%
“…36,37 Because H 2 can reduce the secondary nucleation of CrS 2 . 42,43 The thickness of the grown CrS 2 is uniform. When H 2 and Ar are introduced, the average thickness is about 5.878 nm, while when only Ar is introduced, the average thickness is about 26.845 nm (Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The first one is a reduction in secondary nucleation and delay in the growth process and the second one is an etching of MoS 2 layers due to H 2 . 24,25 Additionally, Figure 2d,e represents the top view FESEM images of MAr and MArH10 samples, which show the presence of islands and vertically aligned flakes on top of the MAr sample, while MArH10 exhibits a significantly smooth and clean surface. These results strongly suggest that the incorporation of H 2 during the growth process creates a reducing environment, leading to a very flat and smooth surface of the MoS 2 film.…”
Section: Structural and Morphological Studymentioning
confidence: 99%
“…During chemical vapor deposition (CVD) of a MoS 2 film, incorporation of H 2 in the growth environment along with the carrier gas, Ar, can serve as an effective approach to engineer the S vacancy-related defects in the MoS 2 film. Most of the previous studies where H 2 has been used along with Ar gas put focus on achieving a clean continuous monolayer of MoS 2 by mitigating secondary nucleation. , Therefore, a comprehensive observation and in-depth understanding of the complex evolution of the excitonic transitions and their Rydberg states in large-area monolayer MoS 2 are lacking, to the best of our knowledge.…”
Section: Introductionmentioning
confidence: 99%
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