2013
DOI: 10.1039/c3nj41140k
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Role of F− in the hydrolysis–condensation mechanisms of silicon alkoxide Si(OCH3)4: a DFT investigation

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Cited by 11 publications
(10 citation statements)
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“…Hydrolysis and condensation of metal oxide precursors (e.g., metal alkoxide) are essential for the formation of inorganic oxide matrixes. In case of silica, the sol‐gel reactions cause polycondensation of the precursor (e.g., silicon alkoxides) and subsequent shrinkage of the silicate frameworks . As shown in Figure , condensation reactions of silanol (Si−OH) and alkoxy (Si−OR) groups (R; alkyl group) leads to the increase of siloxane (Si−O−Si) networks, resulting in the shrinkage of frameworks .…”
Section: Molecular Mechanism Inducing Shrinkagementioning
confidence: 99%
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“…Hydrolysis and condensation of metal oxide precursors (e.g., metal alkoxide) are essential for the formation of inorganic oxide matrixes. In case of silica, the sol‐gel reactions cause polycondensation of the precursor (e.g., silicon alkoxides) and subsequent shrinkage of the silicate frameworks . As shown in Figure , condensation reactions of silanol (Si−OH) and alkoxy (Si−OR) groups (R; alkyl group) leads to the increase of siloxane (Si−O−Si) networks, resulting in the shrinkage of frameworks .…”
Section: Molecular Mechanism Inducing Shrinkagementioning
confidence: 99%
“…In case of silica, the sol-gel reactions cause polycondensation of the precursor (e.g.,s ilicon alkoxides) and subsequents hrinkage of the silicate frameworks. [31,32] As shown in Figure 1, condensation reactions of silanol (SiÀOH) and alkoxy (SiÀOR) groups (R;a lkyl group) leads to the increase of siloxane (SiÀOÀSi)n etworks, resultingi nt he shrinkage of frameworks. [33] Scanning electron microscopy (SEM) clearly shows the change from spherical to oval shapes of pores by anisotropic shrinkage of ap orouss ilica film.…”
Section: Moleculeinteraction Of Oxidementioning
confidence: 99%
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“…In order to further explore the surface compositions and chemical state of the sample, X-ray photoelectron spectroscopy (XPS) was acquired (Figure 3a (Figure 3a), confirming the presence of Bi 3 + . [26][27][28][29] S 2s peak around 225.8 eV can be detected for asprepared Bi 2 S 3 sample ( Figure S1 in the Supporting Information). [30] The two peaks observed between Bi 4f 5/2 and Bi 4f 7/2 are related to S 2p 1/2 at 162.7 eV and S 2p 3/2 at 161.3 eV (Figure 3b).…”
Section: Introductionmentioning
confidence: 99%