Role of Auger electrons in X‐ray excitation by electron beam

Abstract

We present an algorithm that allows an estimation of the number of ionizations of atoms with low atomic number by Auger electrons produced in the matrix during excitation of X‐rays by an electron beam. The dependence of Auger ionization on the atomic number of the matrix has a maximum resulting from the increasing energy of Auger electrons and the decrease of their number as a function of the atomic number. Dependence of the contribution of Auger electrons to the analytical signal on the energy of primary electrons is calculated. Estimates of this contribution to X‐ray emissions by boron, carbon, nitrogen, and fluorine in different matrices are given.

Multiscale Tomographic Analysis for Micron-Sized Particulate Samples

“…The X-rays used are capable of penetrating solid matter, their absorption coefficient being a function of the material density of the sample, the length penetrated, the photon energy, and the atomic number of the compound elements. The measurement parameters are therefore strongly related to the material and its dimensions (Pavlinsky, 2008). Compared to 2D radiological imaging, the tomography setup offers a chance to analyze the 3D structure of objects in the field of view (FOV) without stereological error.…”