2024 IEEE International Reliability Physics Symposium (IRPS) 2024
DOI: 10.1109/irps48228.2024.10529364
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Robustness Assessment Through 77GHz Operating Life Test of Power Amplifier for Radar Applications in 28nm FD-SOI CMOS

F. Cacho,
P. Cathelin,
J. Hai
et al.
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