Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage

Saikiran, Marampally; Ganji, Mona; Chen, Degang

doi:10.1109/itc44778.2020.9325226

Cited by 13 publications

(14 citation statements)

References 28 publications

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“…The first test method used to test the op amp using our framework is called the intentional offset injection (IOI) method first introduced in [10]. In IOI method, either a positive (or negative) offset is injected into the circuit as a control signal by closing the switches 𝑀 𝑝𝑡 (or 𝑀 𝑛𝑡 ).…”

Section: Intentional Offset Injection Methods -Operational Amplifiermentioning

confidence: 99%

“…While the intentional offset injection tests the main circuit of the operational amplifier, the defects in the widlar reference and biasing circuit are tested using three digital window comparators [10] as shown in Fig. 9.…”

Section: Frequency Response Of the Op Ampmentioning

confidence: 99%

“…For this exercise, we test the defects in operational amplifier using two methods. First method is predominantly a DC testing method known as intentional offset injection (IOI) method proposed in [10] . On the other hand, the second testing method is well known transient testing method called Oscillation Test Method (OTM) [15], [16].…”

Section: Defect Simulation: Operational Amplifiermentioning

confidence: 99%

“…In Section 2, the proposed framework is introduced with a sample defect model. In Section 3.1, we check the defects in an operational amplifier using a DC testing scheme called Intentional Offset Injection method [10], [11] using the proposed framework. In Section 3.2, we use oscillation test method (OTM) [8], a predominantly transient detection scheme, to further corroborate the timeefficiency of our framework.…”

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Low-Cost Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Enhanced Time-Efficiency

Saikiran

Sekyere

Ganji

et al. 2022

Preprint

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Defect-oriented testing is becoming increasingly popular in recent times, especially in safety-critical applications in automotive, space and medical industries. The stringent quality requirements from these industries such as zero defective parts per million (DPPM) necessities a need to have efficient defect testing methods. Furthermore, the overall development time of integrated circuit can be reduced by reducing the defect simulation time. In this work, we present a simple and time-efficient defect simulation framework for pre-silicon testing of AMS circuits. In our method, a given defect model is realized using Verilog-A modules and tests multiple defects in a circuit in a single-run simulation. In contrast to the conventional defect simulation framework, our method saves simulation time by avoiding the repetitive work of generating a netlist for each defect and by reducing the time overhead for the simulator to interface with data/file-handling system. To strongly validate our proposed framework, we use diverse AMS circuits such as operational amplifier (op amp), fast transient flipped-voltage follower based low-dropout regulator (FVF LDO) and Successive-approximation-register (SAR) analog-to-digital converters (ADC). For DC testing schemes used for op amp and LDO testing, we show that our proposed framework reduces the simulation time to less than one-tenth (1/10th) in comparison with conventional framework. On the other hand, for the transient testing scheme, the proposed framework reduces the simulation time to less than 50% of the conventional framework. Furthermore, we also show that there is no negative impact on the defect coverage using the proposed framework.

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Section: Intentional Offset Injection Methods -Operational Amplifiermentioning

confidence: 99%

Section: Frequency Response Of the Op Ampmentioning

confidence: 99%

Section: Defect Simulation: Operational Amplifiermentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Low-Cost Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Enhanced Time-Efficiency

Saikiran

Sekyere

Ganji

et al. 2022

Preprint

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show abstract

“…On one hand, ISO26262 Standard for functional safety, recommends an automotive IC needs to have very high defect coverage (>90%) to ensure reliable operations. On the other hand, rigorous testing schemes requires long testing time thereby significantly impacting the overall test cost [4] and invariably increasing production cost as well. Furthermore, the majority of the failures in ICs reported by the customer returns are the in-fields ICs that failed due to latent defects [5].…”

Section: Introductionmentioning

confidence: 99%

Defect Detection and Localization in Operational Amplifiers using Digital Control and Monitor Circuits

Sekyere,

Marampally,

Chen

2023

Preprint

Self Cite

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Operational amplifiers (op amps) are fundamental blocks that find wide application both as stand-alone devices and as crucial building blocks embedded in various Systems on Chips (SoCs). Achieving high defect coverage as well as performing diagnosis and defect localization in these circuits has been proven to be a difficult/expensive task even with sophisticated analog and digital testing circuitry. ISO26262 Standard for functional safety (FuSa) places stringent requirement that an automotive IC must have a very high defect coverage (usually greater than 90%). This reinforce the need to improve the robustness in the design of analog and mixed signal (AMS) circuits to ensure their reliability especially if they are used in mission critical industries. This paper presents a simple defect detection, diagnosis, and localization method for op amps including Widlar current reference and biasing circuitry and can be used both for production and in-field tests for online health monitoring to ensure continued reliability during integrated circuits’ (IC) lifetime. We rigorously validate all our results using extensive transistor-level simulations of two op amps architectures (folded cascode and telescopic) designed in MUSE TSMC 180nm technology. For the folded cascode op amp, the proposed method achieves a worst-case defect coverage of 94.5% and a best-case coverage of 98%. Similarly for the telescopic op amp, the proposed method attains a worst- and best-case defect coverage of 97% and 99% respectively. Furthermore, in this work, we also propose a defect diagnosis and localization strategy using recorded bit streams from states of digital injectors and detectors.

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Low-cost defect simulation framework for analog and mixed signal (AMS) circuits with enhanced time-efficiency

Saikiran

Sekyere

Ganji

et al. 2023

Analog Integr Circ Sig Process

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Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage

Cited by 13 publications

References 28 publications

Low-Cost Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Enhanced Time-Efficiency

Low-Cost Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Enhanced Time-Efficiency

Defect Detection and Localization in Operational Amplifiers using Digital Control and Monitor Circuits

Low-cost defect simulation framework for analog and mixed signal (AMS) circuits with enhanced time-efficiency

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