IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society 2016
DOI: 10.1109/iecon.2016.7793514
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Robust control of piezostage for nanoscale three-dimensional images acquisition

Abstract: Piezoelectric drivers are widely used in nanoscale image acquisition systems. A source of performance degradation of these drivers is hysteresis, which introduces low rate noise and causes a slow continuous drift, decreasing the quality of scanned images. In this paper a sliding mode control policy, based on an estimator of the perturbation due to hysteresis, is applied to the control of a piezostage in a three dimensional images acquisition system, in order to improve control performances and final scanning r… Show more

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Cited by 3 publications
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