Robust Control Chart Application in Semiconductor Manufacturing Process
Sufinah Dahari,
Muzalwana Abdul Talib,
Adilah Abdul Ghapor
Abstract:Statistical Process Control (SPC) charts are frequently used in the semiconductor manufacturing environment to monitor process quality and detect special-cause variations, hence, to take corrective actions when necessary. The important aspects of control charts to consider on production floors are identifying the primary objective of implementing control charts, the type of data to monitor and the most appropriate control limits to establish. When the quality data is a type of attribute data like the proportio… Show more
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