1982
DOI: 10.1107/s0021889882012722
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Rietveld refinement with spallation neutron powder diffraction data

Abstract: The mathematical functions necessary for Rietveld refinement of time-of-flight neutron powder diffraction patterns from spallation sources are developed and a computer program for least-squares analysis is described. The results of Rietveld refinements of nickel and a low-carbon steel are described and discussed. The method fully exploits the high resolution (Ad/d ,--0"3---0.5%) available with powder diffractometers currently in operation on these sources and examples are given of precise determination of atom… Show more

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Cited by 498 publications
(236 citation statements)
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“…A typical diffraction pattern is shown in Fig. 4(b) where the symbols represent the measured intensity and the line is the fit predicted by the Rietveld least squares refinement [13,14]. The lower curve is the difference between the measured and Rietveld predicted intensities.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…A typical diffraction pattern is shown in Fig. 4(b) where the symbols represent the measured intensity and the line is the fit predicted by the Rietveld least squares refinement [13,14]. The lower curve is the difference between the measured and Rietveld predicted intensities.…”
Section: Methodsmentioning
confidence: 99%
“…The Rietveld analysis fits the entire diffraction pattern to determine an overall crystal structure with multiple variables including the atom positions and lattice parameters. However, this study addresses the strain development measured using specific hkl reflections and therefore we used single peak fits, as described in [14], to determine the peak positions and thereby the lattice spacings, d hkl . A comparison between Rietveld and single peak fits is made in [15].…”
Section: Methodsmentioning
confidence: 99%
“…Profile function developed by Von Dreele et al was used for the Rietveld analysis [23]. The background was modeled by 16-terms Chebyschev polynomial function model in GSAS.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…In this experiment, the diffraction spectra obtained form the SMARTS and HIPPO diffractometers were analyzed via a full-pattern Rietveld analysis using the GSAS software package [15]. The space group of the PZT sample used in the Rietveld method was P4mm for a tetragonal phase.…”
Section: Discussionmentioning
confidence: 99%