2009
DOI: 10.1016/j.nima.2008.11.056
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Rietveld analysis software for J-PARC

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Cited by 470 publications
(284 citation statements)
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“…For both measurements X-ray generator was used by Cu-Kα radiation and applied 40 kV and 30 mA, and 2θ region covered from 10° to 90° by 0.02° steps. All crystal structure analysis by Rietveld method was performed using Z-Rietveld, version 0.9.42.4 [11,12]. Profile function is setting by Type A-1, and asymmetry parameters are used as the axial divergence model according to Finger-Cox-Jephcoat [13].…”
Section: Experimental and Data Analysismentioning
confidence: 99%
“…For both measurements X-ray generator was used by Cu-Kα radiation and applied 40 kV and 30 mA, and 2θ region covered from 10° to 90° by 0.02° steps. All crystal structure analysis by Rietveld method was performed using Z-Rietveld, version 0.9.42.4 [11,12]. Profile function is setting by Type A-1, and asymmetry parameters are used as the axial divergence model according to Finger-Cox-Jephcoat [13].…”
Section: Experimental and Data Analysismentioning
confidence: 99%
“…Rietveld refinements for TOF powder ND data were performed using the program Z-Rietveld. 22), 23) The ND data between 0.275 and 0.290 nm were excluded from the Rietveld refinements, because extra peaks (originate from the second shots of fast neutron passing through disk-choppers) appeared in this data range in the wide-d mode measurements.…”
Section: Introductionmentioning
confidence: 99%
“…Rietveld refinements were performed using the program Z-Rietveld ver. 0.9.31 for time-of-flight neutron powder diffraction analyses [12].…”
Section: Methodsmentioning
confidence: 99%