2019 IEEE International Integrated Reliability Workshop (IIRW) 2019
DOI: 10.1109/iirw47491.2019.8989885
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RFID Tag Failure after Thermal Overstress

Abstract: In this work the failure modes and mechanisms are investigated of a commercially available RFID tag, when it is exposed to extreme temperatures well beyond specifications. Both erroneous functioning and malfunctioning are observed after a thermal cycle exposing the tag to an elevated temperature in the 300-550 • C range. Void formation is the dominant failure, leading to a complete malfunction of the tag. Sporadically, the RFID tag returns a wrong identification code after extreme thermal cycling. This effect … Show more

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Cited by 3 publications
(6 citation statements)
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References 10 publications
(16 reference statements)
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“…Equation ( 10) is accurate and computational efficient when the number of meta-IoT sensors is small. Nevertheless, (10) is not fit the case whose number of meta-IoT sensors is large as the summation still incurs high computation complexity.…”
Section: B Received Signal Modelmentioning
confidence: 99%
See 4 more Smart Citations
“…Equation ( 10) is accurate and computational efficient when the number of meta-IoT sensors is small. Nevertheless, (10) is not fit the case whose number of meta-IoT sensors is large as the summation still incurs high computation complexity.…”
Section: B Received Signal Modelmentioning
confidence: 99%
“…Moreover, based on (12), to align the phase of the received signals when different Tx antennas are transmitting, the added phase for beamforming in (10) can be set to…”
Section: B Received Signal Modelmentioning
confidence: 99%
See 3 more Smart Citations