RF Front-End Test Using Built-in Sensors

Abdallah, L.; Stratigopoulos, Haralampos-G.; Mir, Salvador; Kelma, Christophe

doi:10.1109/mdt.2011.131

Cited by 19 publications

(7 citation statements)

References 9 publications

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“…We have selected three popular alternative measurements that have been proposed in the literature for LNAs. In particular, we consider the dc voltages at the gate of M 3 and at the drain of M 1 , which can be monitored using dc probes [31], [32], and the root-mean-square (RMS) of the RF power at the output of the LNA, which can be monitored using an amplitude detector [32]- [35]. These three alternative measurements are obtained for the instances in the total fault model and the marginally functional instances.…”

Section: ) Specification Test Compactionmentioning

confidence: 99%

Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics

Stratigopoulos

Sunter²

2014

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

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International audienceThe accepted approach in industry today to ensure out-going quality in high-volume manufacturing of analog circuits is to directly measure datasheet specifications. To reduce the involved costs it is required to eliminate specification tests or use instead lower-cost alternative tests. However, this is too risky if the resultant fault coverage and yield coverage metrics of the new test approach are not estimated accurately. This paper proposes a methodology to efficiently derive a set of most probable failing and marginally functional circuit instances. Based on this set, we can readily define and estimate fault coverage and yield coverage metrics. Our methodology reduces the required number of Monte Carlo simulations by one or more orders of magnitude. As an illustrative example, the methodology is applied to a radio frequency low-noise amplifier

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Section: ) Specification Test Compactionmentioning

confidence: 99%

Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics

Stratigopoulos

Sunter²

2014

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

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“…First, we record the output of the ED, then the input of the ED is switched to the output of the CS, in order to record the RMS value of the power supply current. The built-in test approach using envelope detectors and current sensors has been extensively studied in the literature [8][9][10][11][12]. It is cost-effective since only DC signals carrying RF information are extracted off-chip.…”

Section: B Bootstrapmentioning

confidence: 99%

Multivariate statistical techniques for analog parametric test metrics estimation

Huang

Stratigopoulos

Abdallah

et al. 2013

2013 8th International Conference on Design &Amp; Technology of Integrated Systems in Nanoscale Era (DTIS)

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The high cost for testing the analog blocks of a modern chip has sparked research efforts to replace the standard tests with less costly alternative tests. However, test engineers are rather reluctant to adopt alternative tests unless they are evaluated thoroughly before moving to production and they are proven to maintain test quality. This paper gives a comprehensive overview of statistical techniques based on density estimation for evaluating analog parametric test metrics during the test development phase. A large-scale simulation study is carried out for the first time with the aim to demonstrate these techniques in action.

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“…Finally, alternate test is a generic technique that aims to map low-cost measurements to the RF performances [13,16,25,30], thus circumventing the need to measure directly the RF performances. Alternate test can also rely on information-rich, low-cost measurements obtained by built-in sensors [1].…”

Section: Introductionmentioning

confidence: 99%

“…To this end, it has been proposed to rely on non-intrusive built-in sensors that have the comparative advantage that let the design intact [1,2]. These non-intrusive sensors capitalize on the undesired phenomenon of process variations.…”

Section: Introductionmentioning

confidence: 99%

Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors

et al. 2015

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International audienceTesting the RF functions of systems-on-chip incurs a very high cost. Built-in test is a promising alternative to facilitate testing and reduce cost. However, designing built-in test circuits that tap into the sensitive RF signal paths, in order to extract useful information for the purpose of testing, often finds the designers reluctant since it results in some performance degradation that needs to be accounted for during the design. In this paper, we study a transparent built-in test approach based on non-intrusive sensors that are not electrically connected to the RF circuit under test. The non-intrusive sensors simply monitor process variations and by virtue of this they are capable of tracking variations in the performances of the RF circuit as well. The alternate test paradigm is employed to map the outputs of the sensors to the performances, in order to replace the standard tests for measuring the performances directly. We discuss in this paper the principle of operation of these sensors and we demonstrate the non-intrusive test approach on a 65nm RF low noise amplifier

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RF Front-End Test Using Built-in Sensors

Cited by 19 publications

References 9 publications

Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics

Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics

Multivariate statistical techniques for analog parametric test metrics estimation

Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors

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