2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems 2007
DOI: 10.1109/smic.2007.322763
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RF characterization and parameter extraction for CMOS device models

Abstract: We describe the measurement and extraction of high-frequency compact model parameters of MOSFETs for use in design of RF applications.

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Cited by 3 publications
(1 citation statement)
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“…As displayed on Fig. 2, this resistance results from the contact resistance along with a salicided polysilicon resistance from contact to active region , and the distributed gate resistance over active area [11], [12]. expression is then (8) with the gate sheet resistance per square, the finger width, and the number of fingers.…”
Section: Design Methodologymentioning
confidence: 99%
“…As displayed on Fig. 2, this resistance results from the contact resistance along with a salicided polysilicon resistance from contact to active region , and the distributed gate resistance over active area [11], [12]. expression is then (8) with the gate sheet resistance per square, the finger width, and the number of fingers.…”
Section: Design Methodologymentioning
confidence: 99%