MTT-S International Microwave Symposium Digest
DOI: 10.1109/mwsym.1975.1123325
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RF Burnout of Mixer Diodes as Induced Under Controlled Laboratory Conditions and Correlation to Simulated System Performance

George E. Morris
1
,
Y. Anand
2
,
V.J. Higgins
3
et al.
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