RF- and noise characterisation of MOSFETs for mobile communications applications

Breuer, V.; Klapproth, L.; Tempel, M.; Böck, Georg; Werther, O.

doi:10.1109/mikon.1998.742806

12th International Conference on Microwaves and Radar. MIKON-98. Conference Proceedings (IEEE Cat. No.98EX195)

DOI: 10.1109/mikon.1998.742806

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RF- and noise characterisation of MOSFETs for mobile communications applications

V. Breuer

L. Klapproth²,

M. Tempel³

et al.

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RF- and noise characterisation of MOSFETs for mobile communications applications

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References 3 publications

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