2021
DOI: 10.1002/adem.202001409
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Review on Strain Localization Phenomena Studied by High‐Resolution Digital Image Correlation

Abstract: She studied Materials Science in Freiberg and received her doctorate and habilitation. Her primary research interests focus on plasticity, fatigue, and related microstructural analysis of materials. Her particular interests are related to the application of complementary in situ characterization techniques for better understanding of kinetics of deformation and damage processes. To date she has authored or coauthored over 100 peer-reviewed publications.

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Cited by 26 publications
(10 citation statements)
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“…The dislocation density, transformation volume percent and subsequent stress increase significantly when moving towards the ceramic/matrix interface. This very high localization of attributes has also reported by researchers previously [54,55]. Closely looking at the trends in (ii) damage zones and subsequent strain spikes are observed on the ceramic/matrix interface and grain boundaries of highly misoriented grains.…”
Section: Local Trendssupporting
confidence: 85%
“…The dislocation density, transformation volume percent and subsequent stress increase significantly when moving towards the ceramic/matrix interface. This very high localization of attributes has also reported by researchers previously [54,55]. Closely looking at the trends in (ii) damage zones and subsequent strain spikes are observed on the ceramic/matrix interface and grain boundaries of highly misoriented grains.…”
Section: Local Trendssupporting
confidence: 85%
“…The challenge here is that DIC measurements require surface markers to allow tracking of surface IOP Publishing doi:10.1088/1757-899X/1249/1/012006 6 displacements. In some cases these markers can be microstructural features such as those visible after chemical etching [28]. This, however, is not compatible with collection of EBSD data on metallic samples where a highly polished (either mechanically or electrolytically) smooth flat surface is required.…”
Section: Surface Patterning To Allow Combined Dic and Ebsd During In-...mentioning
confidence: 97%
“…This version of DIC is used to estimate 3D displacement fields on the specimen surface. The surfaces over which measurements are made with DIC are typically several cm 2 in size, but this technique can also be used at the microscale with SEM [5][6][7][8]. DIC is sometimes coupled with EBSD to correlate the results with crystal orientations, as illustrated later on in this paper.…”
Section: Digital Image Correlationmentioning
confidence: 99%