Review of an Internal Charging Code, NUMIT

Jun, I.; Garrett, Henry; Kim, Wousik; Minow, J. I.

doi:10.1109/tps.2008.2003440

Cited by 41 publications

(6 citation statements)

References 11 publications

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“…5). It is in agreement with the results of NUMIT in literature [4]. According to the theory of interaction between incident electrons and material, the mainly energy loss effects are ionization and bremsstrahlung, and the former is much larger than the latter in several-MeV energy.…”

Section: A Electron Transport Simulationsupporting

confidence: 92%

“…There exist several software tools which enable spacecraft designers to predict the sensitivity of spacecraft structures to internal charging effects, such as DICTAT [1], [3], NUMIT [4] and ATICS (Assessment Tool of Internal Charging for Satellite) [5], [6]. Their common points are that they are able to compute maximum electric field for planar or cylindrical dielectric and assess discharge risk by means of comparing between electric field and breakdown threshold.…”

Section: Introductionmentioning

confidence: 99%

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A 3-dimensional model of internal charging simulation

Tang

Zhong

Zhang

et al. 2013

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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To break through the limitation of the traditional 1-dimensional (1-D) method of internal charging computation, a 3-D calculation model of internal electric field and potential for arbitrary configuration dielectric with complex boundary conditions is developed. It includes two steps: 3-D electron transport simulation and internal electric field computation. The transport simulation, which aims for obtaining electron deposition and dose rate distribution, is implemented by a self-developed software founded on GEANT4. And the calculation of 3-D internal electric field, which takes above transport results as input, is conducted through solving a set of electrostatic equations by the software COMSOL Multiphysics. In this paper, this 3-D simulation model applied to a typical printed circuit board grounded on a rectangular circuit and cylindrical pin will be presented. For purpose of comparison, a simpler 1-D planar dielectric wholly grounded on the back surface is simulated in the same method. Finally, the electric field computed by the 3-D algorithm is much larger than the 1-D simplified method widely used at present and hence the 1-D method may neglect crucial risk. Besides, the following conclusions are drawn: grounding has significant influence on electric field distribution, and the maximum field generally occurs at grounding edges or corners. Increasing the curvature radius of the circuit corner can reduce the field and the discharge risk.Index Terms -3-D simulation, internal charging, internal electric field, GEANT4

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Section: A Electron Transport Simulationsupporting

confidence: 92%

Section: Introductionmentioning

confidence: 99%

A 3-dimensional model of internal charging simulation

Tang

Zhong

Zhang

et al. 2013

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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“…Above the critical dielectric temperature, the electric field strength and charging time decrease rapidly according to the dielectric temperature at a given energetic electron flux. Below the critical temperature, the electric field strength increases and charging time decreases rapidly when the energetic electron flux increases at a given dielectric temperature [5,20].…”

Section: Discussionmentioning

confidence: 99%

“…A monodirectional electron is assumed to impinge the dielectric [5]. Considering a one-dimensional planar approximation at a depth X in the dielectric, a solution of Poisson' equation for ı and J independent of time is [11],…”

Section: B Deep Dielectric Charging Modelmentioning

confidence: 99%

“…Based on developed theory models of dielectric conductivity, an engineering specification DICTAT has been created to calculate the electric field of DDC (deep dielectric charging) and establish the breakdown mechanisms [4]. In addition, a 1-D internal charging code NUMIT is used to simulate the DDC process of dielectrics with a given conductivity [5].…”

Section: Introductionmentioning

confidence: 99%

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A simulation of deep dielectric charging induced by dielectric temperature and energetic electrons

Min

et al. 2010

2010 10th IEEE International Conference on Solid Dielectrics

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In this paper, a computer numerical simulation of onedimensional deep dielectric charging (DDC) of spacecrafts induced by temperature and energetic electrons has been developed. It provides a method for spacecraft engineers to analyze the phenomena of DDC in spacecrafts and then to predict whether or when electrostatic discharging (ESD) will occur. The simulation code is developed to analyze the influence of different magnitude of dielectric temperature and energetic electrons flux on deep dielectric charging/discharging occurrence. In the simulation, we find that there exists an ESD inception energetic electron flux threshold. The flux threshold decreases with the decrease of dielectric temperature. It is interesting that there exists a critical dielectric temperature (250 K for low-density polyethylene) in the DDC process. Below the critical temperature or above that, respectively, the energetic electron flux and the dielectric temperature are the dominated influencing factors in the DDC process. Then, considering the DDC electric field and the charging time, we present a rough prediction of discharging occurrence probability with varied flux of energetic electrons and dielectric temperature.

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