“…These techniques include photo-imaging analysis of assemblies of twodimensional (2D aluminum or photoelastic rods) (Oda andKonishi 1974, Matsuoka andGeka 1983), thin-section analysis (Oda 1972, Oda et al 1985, Frost and Kuo 1996, Kuo and Frost 1997, X-ray computed tomography (Lee et al 1992, Lee and Dass 1993, Desrues et al 1996, laser-aided tomography (Konagai et al 1992, Konagai andRangelow 1994), and indirect measurement of electrical resistance or wave velocity (Arulmoli andArulanandan 1994, Santamarina andCascante 1996).…”