Review - Nonferrous Metallurgy

Moss, Marvin

doi:10.1021/ac60100a605

Anal. Chem.

1955

DOI: 10.1021/ac60100a605

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Review - Nonferrous Metallurgy

Marvin Moss¹

Abstract: Recent advances in x-ray fluorescence analysis are rapidly bringing this method into prominence. Because of the relative independence of x-ray excitation on metallurgical structure and the ease of analyzing comparatively large surface areas, the method is not subject to the rigid requirements for sample preparation characteristic of spectroscopic methods. X-ray fluorescence

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1958

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Spectrographic Determination of Trace Elements in Metals

Nokris

1958

Symposium on Spectrochemical Analysis for Trace Elements

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The problem of the determination of trace quantities of impurities in metals has existed almost since the time of the first metal preparations of the cave men and exists today in the newest proposed alloys for high-temperature use or reactor construction. During this span of time only the definition of trace has changed. In early times, a trace might have been considered to be any quantity in the low percentage range; at present, we are most likely to define the term with reference to the field of endeavor in which we work. Current thinking in some metallurgical fields might define a trace to be 1000 ppm or less while in another area of operations it might well mean 1 ppm. In the field of semiconductors covered by James M. Morris, and Francis Pink, in this symposium, he might well refer to parts per billion as a trace impurity. In order to be able to limit the scope of this paper, the value of 100 ppm has arbitrarily been chosen as an upper limit for trace elements in metals.

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Spectrographic Determination of Trace Elements in Metals

Nokris

1958

Symposium on Spectrochemical Analysis for Trace Elements

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Review - Nonferrous Metallurgy

Cited by 1 publication

References 106 publications

Spectrographic Determination of Trace Elements in Metals

Spectrographic Determination of Trace Elements in Metals

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