Reverse Gate Bias Stress on high-voltage AlGaN/GaN-on-Si Heterostructure FETs

Choi, Seungkyu; Lee, J.; Yoon, Hee-Jung; Cha, Ho-Young; Kim, H.

doi:10.7567/ssdm.2012.f-9-1

Extended Abstracts of the 2012 International Conference on Solid State Devices and Materials 2012

DOI: 10.7567/ssdm.2012.f-9-1

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Reverse Gate Bias Stress on high-voltage AlGaN/GaN-on-Si Heterostructure FETs

Seungkyu Choi

J. Lee

Hee-Jung Yoon

et al.

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Reverse Gate Bias Stress on high-voltage AlGaN/GaN-on-Si Heterostructure FETs

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References 3 publications

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