Revealing the Structure/Property Relationships of Semiconductor Nanomaterials via Transmission Electron Microscopy
Peili Zhao,
Yongfa Cheng,
Lei Li
et al.
Abstract:Transmission electron microscopy (TEM) offers unprecedent atomic resolution imaging and diverse characterizations capabilities, which has been proved to be effective in correlating the atomic structures and compositions with the physical/chemical properties of semiconductor nanomaterials. This review aims to provide an overview of the latest advancements regarding the atomic structure/property relationship in semiconductor nanomaterials. First, by employing off‐axis electron holography, a comprehensive overvie… Show more
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