2019
DOI: 10.1002/adom.201901084
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Revealing Phonon Polaritons in Hexagonal Boron Nitride by Multipulse Peak Force Infrared Microscopy

Abstract: Probing of polaritons in 2D materials is facilitated by spectroscopic imaging with nanometer spatial resolution. The combination of atomic force microscopy and infrared laser sources provides access for in situ mappings of phonon polaritons. Here, it is demonstrated that the photothermal‐based peak force infrared microscopy is capable of revealing phonon polaritons with high spatial resolution in isotopically pure hexagonal boron nitride microstructures without damaging the sample. To further improve the sensi… Show more

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Cited by 20 publications
(34 citation statements)
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“…Besides s-SNOM, AFM-based photothermal infrared microscopy has also revealed the PhPs in h-BN by detecting fringes. 5,[16][17][18] . However, no prior aqueous phase mid-infrared nano-imaging of PhPs in h-BN has been explored in the aqueous phase due to various challenges, from high light delivery loss to anharmonicity in cantilever oscillation in water.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Besides s-SNOM, AFM-based photothermal infrared microscopy has also revealed the PhPs in h-BN by detecting fringes. 5,[16][17][18] . However, no prior aqueous phase mid-infrared nano-imaging of PhPs in h-BN has been explored in the aqueous phase due to various challenges, from high light delivery loss to anharmonicity in cantilever oscillation in water.…”
Section: Resultsmentioning
confidence: 99%
“…Here, LiPFIR reveals the characteristic frequency-dependent interference fringes from hyperbolic phonon polaritons in 10 It combines the recently developed multipulse peak force infrared (PFIR) microscopy with total internal reflection beam delivery in the liquid phase. [12][13] The scheme of the apparatus of LiPFIR is illustrated in Figure 1a. A liquid-phase AFM (Bioscope Catalyst, Bruker) with a fluid chamber is operated under the peak force tapping mode at the peak force tapping (PFT) frequency of 1 kHz by an AFM controller (Nanoscope V, Bruker).…”
Section: Introductionmentioning
confidence: 99%
“…is performed to remove the slow varying curvature of the cantilever deflection in Figure 1f to retrieve pure oscillations at the repetition frequency of the laser pulse ( Figure 1g). This procedure bypasses the self-reference scheme of the original PFIR microscopy, 6,23 and doubles the signal acquisition speed. The amplitude of the cantilever oscillations is extracted with a fast Fourier transform.…”
Section: Operational Principle and Design Of Lipfir Microscopymentioning
confidence: 99%
“…A polynomial fit is performed to remove the slow varying curvature of the cantilever deflections in Figure 1f to retrieve cantilever oscillations at the laser repetition rate shown in Figure 1g. The procedure bypasses the self-reference scheme of the standard PFIR microscopy, 4,23 and doubles the signal acquisition speed. The amplitude of the cantilever oscillations is extracted with a fast Fourier transform.…”
Section: Operational Principle and Design Of Lipfir Microscopymentioning
confidence: 99%