1982
DOI: 10.1016/0022-0248(82)90354-2
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Revealing of dislocations in ZnS by chemical etching

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Cited by 7 publications
(1 citation statement)
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“…Samples were polished, etched with an aqueous solution of H 2 SO 4 –K 2 Cr 2 O 7 –H 2 O (K‐etchant, 27 ) and imaged using a standard optical microscope or a scanning electron microscope, LEO 1455VP SEM, (Oberkochen, Germany) operated in vacuum mode at 10 −3 torr at 20 kV with a filament current of ∼2.45 μA. Finally, some samples were characterized using a Hitachi H‐8100 transmission electron microscrope (TEM, Tokyo, Japan) to look for nanoscale structural features.…”
Section: Methodsmentioning
confidence: 99%
“…Samples were polished, etched with an aqueous solution of H 2 SO 4 –K 2 Cr 2 O 7 –H 2 O (K‐etchant, 27 ) and imaged using a standard optical microscope or a scanning electron microscope, LEO 1455VP SEM, (Oberkochen, Germany) operated in vacuum mode at 10 −3 torr at 20 kV with a filament current of ∼2.45 μA. Finally, some samples were characterized using a Hitachi H‐8100 transmission electron microscrope (TEM, Tokyo, Japan) to look for nanoscale structural features.…”
Section: Methodsmentioning
confidence: 99%