Optical Measurement Systems for Industrial Inspection X 2017
DOI: 10.1117/12.2270116
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Revealing features of different optical shaping technologies by a point diffraction interferometer

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Cited by 2 publications
(3 citation statements)
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“…Components of the flat surface form like spherical aberration are explicitly small related to polishing and finishing process e.g. lapping 9 and can be regarded as being below the admissible level according to considerations discussed in the introduction and numerical data shown below in this section. In any case the calibration wavefront CW can be defined using a calibration flat mirror specially manufactured with requirement to decrease a possible rotational symmetry of its irregularity.…”
Section: Measurements With Using the Accessory Lens Da2 And Systemati...mentioning
confidence: 99%
See 1 more Smart Citation
“…Components of the flat surface form like spherical aberration are explicitly small related to polishing and finishing process e.g. lapping 9 and can be regarded as being below the admissible level according to considerations discussed in the introduction and numerical data shown below in this section. In any case the calibration wavefront CW can be defined using a calibration flat mirror specially manufactured with requirement to decrease a possible rotational symmetry of its irregularity.…”
Section: Measurements With Using the Accessory Lens Da2 And Systemati...mentioning
confidence: 99%
“…The nominal form of X-ray mirrors can be measured with accuracy 0.5 nm RMS 8 either at once, if their aperture is smaller than the D7 field of view (FOV), or with subaperture stitching. The form features and technological traces of optical processing can be revealed with accuracy 0.3 -0.7 nm RMS 9 . In addition, absence of retrace error and minimization of fringe print-through error give wide opportunities to apply supplementary optics for transformation of testing beams to test variety of surfaces with reliable defining and removing the systematic error, as it will be shown below in this paper.…”
Section: Introductionmentioning
confidence: 98%
“…Traditional interferometers, such as Fizeau interferometer and Twyman-Green interferometer, can be applied to achieve the high-precision wavefront testing in order of nanometers. The novel point-diffraction interferometer (PDI) has also been proposed to improve the testing accuracy better than sub-nanometers [5][6][7][8], and it further extends the application of interferometry in ultrahigh-precision testing. Different from traditional interferometers, PDI employs an ideal diffraction spherical wavefront from either a pinhole or optical fiber as the reference standard, rather than the standard lens, and it can achieve both high measurement accuracy and repeatability.…”
Section: Introductionmentioning
confidence: 99%