2007
DOI: 10.1109/tmag.2006.888198
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Return Field-Induced Partial Erasure in Perpendicular Recording Using Trailing-Edge Shielded Writers

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Cited by 25 publications
(12 citation statements)
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“…However, H/S stacked media showed experimental results of positive nucleation field (H n ) [9,12] and relatively low negative H n [10] compared to CL media. A more negative value of H n is essential for overcoming adjacent track erasure (ATE) and return field-induced partial erasure (RFPE) [13,14].…”
Section: Introductionmentioning
confidence: 99%
“…However, H/S stacked media showed experimental results of positive nucleation field (H n ) [9,12] and relatively low negative H n [10] compared to CL media. A more negative value of H n is essential for overcoming adjacent track erasure (ATE) and return field-induced partial erasure (RFPE) [13,14].…”
Section: Introductionmentioning
confidence: 99%
“…4͑b͔͒ associated with higher write current for type B heads may cause more severe return field induced partial erasure of previously written bits, resulting in serious degradation of the recording performance as previously reported. 15 As mentioned, quantitative MFM measurements of magnetic field strength ͑H z ͒ at a SH could be performed by two times integrating measured frequency ͑or phase͒ shift ⌬f at a series of tip SHs over perpendicular ͑z͒ direction from a far distance ͑where MFM contrast is negligibly small͒ to the measurement SH. To quantitatively measure the field strength, a series of SH ͑10-300 nm͒ were used to take MFM images for both types of heads.…”
mentioning
confidence: 99%
“…2. Bai [4] called this erasure return field partial erasure (RFPE). Actually low moment SUL provides larger negative H y peak at the TS and larger H x peak at the write gap resulting in larger negative H eff peak when it is saturated with high write current.…”
Section: Low Moment Sul Effectsmentioning
confidence: 99%