2017
DOI: 10.1016/j.apsusc.2016.11.236
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Retrieval of the non-depolarizing components of depolarizing Mueller matrices by using symmetry conditions and least squares minimization

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Cited by 1 publication
(3 citation statements)
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“…The former case commonly arises in finite spot size measurements in reflection configuration where the spot covers two optically different areas, e.g. an isotropic substrate and an anisotropic diffraction grating ruled in it [27][28][29][30][31]. The latter case is typical of optically thick slabs of transparent homogeneous material (e.g.…”
Section: Twelve-element Partial Mueller Polarimetrymentioning
confidence: 99%
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“…The former case commonly arises in finite spot size measurements in reflection configuration where the spot covers two optically different areas, e.g. an isotropic substrate and an anisotropic diffraction grating ruled in it [27][28][29][30][31]. The latter case is typical of optically thick slabs of transparent homogeneous material (e.g.…”
Section: Twelve-element Partial Mueller Polarimetrymentioning
confidence: 99%
“…For instance, this is the case with an (anisotropic) diffraction grating whose lateral dimensions are smaller than the spot size, ruled in an (isotropic) substrate. There exist both algebraic [29,30] and numerical [31] robust practical procedures for recovering the two components M 1 and M bd given the experimental M.…”
Section: Mueller Matrix One Of Whose Two Matrix Components Is Of Specmentioning
confidence: 99%
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