2020
DOI: 10.1007/s11665-020-04730-z
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Retardation Effect of Tin Multilayer on Sn-3.0Ag-0.5Cu (SAC305)-Based Solder Joint Interface

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Cited by 3 publications
(8 citation statements)
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“…Authors have also previously identified the presence of (ε‐Cu 3 Sn + η‐Cu 6 Sn 5 ) intermetallics at the interface of such, Cu–SAC305 solder joints produced at 230 °C reflow temperature. [ 27 ] After electron dispersive spectroscopy followed by transmission electron microscopy‐selected area diffraction pattern analysis Kar et al [ 30 ] confirms the presence of ε and η at the interface. It was also confirmed that the formation of thicker intermetallics contributes to the embrittlement of the solder joint interface.…”
Section: Resultsmentioning
confidence: 99%
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“…Authors have also previously identified the presence of (ε‐Cu 3 Sn + η‐Cu 6 Sn 5 ) intermetallics at the interface of such, Cu–SAC305 solder joints produced at 230 °C reflow temperature. [ 27 ] After electron dispersive spectroscopy followed by transmission electron microscopy‐selected area diffraction pattern analysis Kar et al [ 30 ] confirms the presence of ε and η at the interface. It was also confirmed that the formation of thicker intermetallics contributes to the embrittlement of the solder joint interface.…”
Section: Resultsmentioning
confidence: 99%
“…It is reported in previous studies [ 46,47 ] that the thicker IMC layers formed gradually at the interface, due to the diffusion of Cu from the substrate into solder alloy. Char et al [ 27 ] have reported that different kinetics for the IMC layer growth has been observed in the presence and in absence of Sn thin film. Relatively faster IMC layer growth has been reported for the solder joints produced in absence of Sn interlayers.…”
Section: Resultsmentioning
confidence: 99%
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