Results of the round robin calibration of reference solar cells within the PhotoClass project

Kröger, Ingo; Friedrich, Dirk; Winter, S.; Salis, Elena; Müllejans, Harald; Pavanello, Diego; Hohl‐Ebinger, Jochen; Bothe, Karsten; Hinken, David; Dittmann, Sebastian; Friesen, Gabi; Bliss, Martin; Betts, Tom; Gottschalg, Ralph; Rimmelspacher, Lorentz; Stang, J.H.; Herrmann, W.; Dubard, J.

doi:10.1051/ijmqe/2018006

Cited by 6 publications

(7 citation statements)

References 15 publications

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“…A round-robin among nine different laboratories conducted within the European Metrology Research Programme concluded that the standard deviation of the different calibration values for the same reference cell was 0.81%. 19 An intercomparison of high-efficiency c-Si module calibration between five reference Asian and European laboratories showed a short-circuit current agreement of the same order. 20 Calibration certificates of PV modules measured at STC from accredited laboratories typically declare that uncertainty in short-circuit current, which is closely the same as uncertainty in G when the modules are used as irradiance sensors, is about u CAL G = 1.8%.…”

Section: Uncertainty Derived From G and T C Sensorsmentioning

confidence: 78%

“…Traceability chains for terrestrial c‐Si PV devices' calibration are currently well established. A round‐robin among nine different laboratories conducted within the European Metrology Research Programme concluded that the standard deviation of the different calibration values for the same reference cell was 0.81% 19 . An intercomparison of high‐efficiency c‐Si module calibration between five reference Asian and European laboratories showed a short‐circuit current agreement of the same order 20 .…”

Section: Uncertainty In Pv Module Characterizationmentioning

confidence: 97%

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On outdoor testing procedures of large samples of PV modules

Lorenzo,

Moretón,

Solorzano

et al. 2023

Progress in Photovoltaics

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STC power control of PV module supply requires testing large samples of modules with low uncertainty. This paper analyses the feasibility of outdoor measurements with the modules kept at their operating positions. The classical procedure of recording I‐V curves and translating them to STC in accordance with IEC‐60891:2021 using the cell temperature directly observed at a few points of the rear of the module entails expanded uncertainties larger than 3% (k = 2), which is too much for this procedure being accepted in quality controls with contractual consequences. A convenient procedure for overcoming this barrier consists in comparing the I‐V curves of a tested and a reference module of the same type, both working under the same operating conditions. The latter is mostly secured if they are in adjacent positions. However, when the procedure is applied to large samples of PV modules kept in their operating positions, the distance between both modules can reach tens of meters and significant inter‐module temperature differences can arise. A method for counterbalancing these differences consists of correcting the measured power values by considering the temperature difference observed at the back‐sheet centres of the tested and the reference modules. That also provides clues to estimating the uncertainty of the results. This procedure has been applied in seven testing campaigns, carried out at commercial PV plants. Dedicated instrumentation, based on two radio linked I‐V tracers, allowing the simultaneous measurement of the I‐V curves and of the temperature at the centres of the reference and the tested modules, has been developed for that. The resulting uncertainties are similar to those corresponding to high‐quality solar simulators and low enough for dealing, in practice, with strict quality control requirements.

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Section: Uncertainty Derived From G and T C Sensorsmentioning

confidence: 78%

Section: Uncertainty In Pv Module Characterizationmentioning

confidence: 97%

On outdoor testing procedures of large samples of PV modules

Lorenzo,

Moretón,

Solorzano

et al. 2023

Progress in Photovoltaics

View full text Add to dashboard Cite

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“…We compare these values to measurement uncertainties at ISFH CalTeC, which typically are around ±1.0% (level of confidence of approximately 95% [ 34 ] ) for small and large‐area devices [ 14 ] and to measurement uncertainties from NMI reaching values down to ±0.50%. [ 35 ] For WPVS 1, WPVS 2, and the large‐area reference cell, the relative deviations obtained are smaller than these typical measurement uncertainties. WPVS 3 shows a larger relative deviation of −0.68%, probably caused from the lower wavelength resolution in this region.…”

Section: Discussion and Outlookmentioning

confidence: 92%

Multi‐Spectrum Method for the Determination of the Spectral Responsivity and the Short‐Circuit Current of Photovoltaic Devices

et al. 2023

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Herein, a method for the determination of the spectral responsivity (SR) and the short‐circuit current under standard test conditions of photovoltaic devices (e.g., solar cells) is presented. This multi‐spectrum SR method requires a spectrally tunable broadband light source irradiating the photovoltaic device with a large number of different spectra. For each spectrum, the light response of the device and the spectral irradiance in the measuring plane are measured. The spectral irradiances are integrated within predefined wavelength intervals and are incorporated together with the measured light response into an equation system which relates them to the (unknown) SR of the photovoltaic device. By solving the equation system, mathematically using regression algorithms, the SR is determined. Due to the usage of a broadband light source, the device operates at realistic injection conditions during measurements. The mathematical background of the multi‐spectrum SR method is described and its applicability is demonstrated on three world‐photovoltaic‐scale‐type solar cells and one large‐area reference cell. Short‐circuit currents from all SR curves are calculated using the tabulated AM1.5 G spectrum. In comparison to the SR reference data, the short‐circuit currents from the multi‐spectrum SR method deviate by less than 0.68%.

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“…In addition, as good practice for measurement and testing laboratories, and even required for calibration laboratories accredited to ISO/IEC 17025, 16 in the last 30 years several interlaboratory comparisons and round-robins have already been organised for SJ PV testing at STC. [17][18][19][20][21][22][23][24][25] The World Photovoltaic Scale (WPVS) itself, which nowadays has become a sort of alias to refer to a solar cell with some standardised package, was in fact established in 1999 as measurement scale for PV starting from a dedicated world-wide intercomparison on calibration of PV cells. [26][27][28] Similar measurement comparisons are less numerous and less geographically wide in the case of MJ PV devices.…”

Section: Introductionmentioning

confidence: 99%

A European proficiency test on thin‐film tandem photovoltaic devices

Salis

Gerber

Andreasen

et al. 2020

Progress in Photovoltaics

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A round-robin proficiency test (RR PT) on thin-film multi-junction (MJ) photovoltaic (PV) cells was run between 13 laboratories within the European project CHEETAH. Five encapsulated PV cells were circulated to participants for being tested at Standard Test Conditions (STC). Three cells were a-Si/μc-Si tandem PV devices, each of which had a different short-circuit current ratio between the top junction and the bottom one; the remaining two cells were single-junction PV devices made with material representative of the individual junctions in the MJ cells. The RR PT's main purpose was to assess the capability of the participating laboratories, in terms of employed facilities and procedures, to test MJ PV devices. Therefore, participants

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Results of the round robin calibration of reference solar cells within the PhotoClass project

Cited by 6 publications

References 15 publications

On outdoor testing procedures of large samples of PV modules

On outdoor testing procedures of large samples of PV modules

Multi‐Spectrum Method for the Determination of the Spectral Responsivity and the Short‐Circuit Current of Photovoltaic Devices

A European proficiency test on thin‐film tandem photovoltaic devices

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