AIP Conference Proceedings 1999
DOI: 10.1063/1.59316
|View full text |Cite
|
Sign up to set email alerts
|

Results of recent tests of NEC AMS systems

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1999
1999
2007
2007

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…The need for a reliable 14 C AMS system that can measure low 14 C concentrations prompted us to select the proven technology of a National Electrostatics Corporation (NEC) 0.5MV compact sys-tem (Sundquist et al 1999;Suter et al 2000). The single-stage, 250-kV acceleration unit (Schroeder et al 2004) was also considered but later discarded as at the time there was no sufficient independent validation that it could provide the desired machine background level.…”
Section: Introductionmentioning
confidence: 99%
“…The need for a reliable 14 C AMS system that can measure low 14 C concentrations prompted us to select the proven technology of a National Electrostatics Corporation (NEC) 0.5MV compact sys-tem (Sundquist et al 1999;Suter et al 2000). The single-stage, 250-kV acceleration unit (Schroeder et al 2004) was also considered but later discarded as at the time there was no sufficient independent validation that it could provide the desired machine background level.…”
Section: Introductionmentioning
confidence: 99%