2007
DOI: 10.1063/1.2718191
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Results of 2006 UT Modeling Benchmark Obtained with CIVA at CEA: Beam Modeling and Flaw Signal Prediction

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“…This defect was generated as a slot machined into the test-piece from the back-wall. This type of defect is typically inspected using the corner echo effect [4].…”
Section: Target Application For the Membrane Coupled Devicementioning
confidence: 99%
“…This defect was generated as a slot machined into the test-piece from the back-wall. This type of defect is typically inspected using the corner echo effect [4].…”
Section: Target Application For the Membrane Coupled Devicementioning
confidence: 99%