2011
DOI: 10.1016/j.jcrysgro.2010.10.192
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Response-time-improved ZnO scintillator by impurity doping

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Cited by 36 publications
(23 citation statements)
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“…With regards to scintillator applications, a bulk ZnO single crystal has been reported to exhibit fast emission lifetime of about 1.0 ns regardless of the incident excitation [7]. The lifetimes can be improved through intentional doping with the introduction of additional quenching channels [8][9][10][11] or through the use of nanostructures with enhanced oscillator strengths [12].…”
Section: Introductionmentioning
confidence: 99%
“…With regards to scintillator applications, a bulk ZnO single crystal has been reported to exhibit fast emission lifetime of about 1.0 ns regardless of the incident excitation [7]. The lifetimes can be improved through intentional doping with the introduction of additional quenching channels [8][9][10][11] or through the use of nanostructures with enhanced oscillator strengths [12].…”
Section: Introductionmentioning
confidence: 99%
“…2) The ZnO crystal has a fast response time of about 1.0 ns regardless of the optical excitation source. [2][3][4] ZnO response times can be further improved by impurity doping with the introduction of additional quenching channels [5][6][7] or by the possible use of nanostructures that maximize the oscillator strength. 8) In realizing ZnO scintillator applications, the effects of radiation environments are of particular interest.…”
mentioning
confidence: 99%
“…Time-resolved measurements of reflection, transmission, and photoluminescence spectroscopies have been carried out by a pump-probe method on various ZnO samples, i.e., nanocrystals and single crystals. [5][6][7][8][9][10] These authors have reported that the recombination processes of the photo-generated electron-hole (e-h) pairs or excitons are enhanced by the trapping of the carriers at impurity levels in the bulk band gap. Recently, a time-resolved photoelectron spectroscopy (PES) experiments were carried out on a ZnOð10 10Þ surface to trace the relaxation process of the surface photovoltage (SPV) effect to clarify the photo-generated carrier dynamics as one of the important elementary processes.…”
mentioning
confidence: 99%
“…11 Surface-sensitive results are obtained by PES as compared to optical methods. [5][6][7][8][9][10] The temporal variation of the relaxation process was described in terms of surface e-h recombination after the carrier transfer from the internal bulk to the surface over the surface potential. Time-resolved PES measures the temporal variations of the surface potential.…”
mentioning
confidence: 99%