Surface analysis techniques, including x‐ray photoelectron spectroscopy with small‐spot analysis (down to 100 µm2) capabilities, field emission scanning Auger microscopy, electron energy‐loss spectroscopy in association with these two techniques and micro‐Raman spectroscopy, have been used to collect surface information on specific facets of commercially available submillimetre‐sized cubic boron nitride (cBN) crystals. With the freedom of choosing a specific facet with a known orientation relative to the probing beam and detector, it is possible to obtain accurate information on the surface compositional structure of a cBN crystal before and after a surface reaction. Copyright © 1999 John Wiley & Sons, Ltd.