Resonant-cavity-enhanced ultraviolet metal-semiconductor-metal photodetectors were successfully fabricated in AlGaN system, for the first time. A 45 nm GaN light absorption layer was placed in the optical cavity composed by the multi-stacked Al 0.06 Ga 0.94 N/AlN (20 pairs) bottom-distributedBragg-reflector (DBR) and the ZrO 2 /SiO 2 (two pairs) top-DBR mirrors. In this structure, the enhancement of responsivity can be achieved by incorporating a multiple pass detection scheme. In the experiment, the responsivity was enhanced by the resonant cavity effect, selectively at 363 and 352 nm in wavelength, with a factor of about two, in contrast with the case without the top-DBR.Introduction Ultraviolet (UV) photo-detectors (PDs) are extensively investigated for their potential applications to solar UV monitoring (visible-and solar-blind detections), flame sensors, space communications and so on. AlGaN compounds are promising materials for UV-PDs, due to its superior material properties, such as wide-and directband-gap, radiation hardness, high temperature resistance, and high saturation electron drift velocity. So far, AlGaN-based UV-PDs have been fabricated on Al 2 O 3 substrates, with various detection schemes of metal-semiconductor-metal (MSM) PDs [1, 2], Schottky photovoltaic detectors [3], and pin photodiodes [4]. These PDs consist of a single pass detection scheme, which is responsive to a wide wavelength range below the band-edge of an absorption layer.Meanwhile, in the resonant-cavity-enhanced (RCE) detection scheme [5, 6], a single absorption layer serves many times in generating photo-carriers (a multi-pass detection scheme), and the responsivity is enhanced dramatically at resonant wavelengths due to its resonant-cavity effect. Thus it can detect only for a specific UV line, such as an atomic UV-emission line. Furthermore, a proper design of the resonant cavity may produce h over 80-90% even for a thin absorption layer thickness d [5]. In the first report, RCE-PDs were performed with AlGaAs/GaAs heterojunction photo-transistors (HPT) [7], GaInAs/AlInAs Schottky PDs [8], followed by the theoretical formulation and the systematic analysis of RCE-PDs [5]. Following that, various RCE-PDs with high-performance were demonstrated, for example InGaAs/InP p-i-n RCE-PD with h of 0.8 for d ¼ 200 nm [9], and the GaAs/AlGaAs RCE-Schottky-PD with h of 0.5 for d ¼ 150 nm [10].In this paper, AlGaN-based UV-PDs with the RCE detection scheme are discussed theoretically and RCE-UV-MSM-PDs with GaN absorption layers were fabricated for